Sic.Framework-Nanjing-Baishi/MECF.Framework.Common/MECF/Framework/Common/DBCore/WaferProcessDataRecorder.cs

51 lines
1.7 KiB
C#

using System;
using System.Collections.Generic;
using System.Data;
using Aitex.Core.RT.DBCore;
using Aitex.Core.RT.Log;
using Aitex.Sorter.Common;
namespace MECF.Framework.Common.DBCore
{
public class WaferProcessDataRecorder
{
public static void WaferProcessDataRecord(string guid, string station, string dataName, string dataValue)
{
string sql = string.Format("INSERT INTO \"wafer_process_data\"(\"wafer_guid\", \"process_time\", \"station\", \"data_name\", \"data_value\" )VALUES ('{0}', '{1}', '{2}', '{3}', '{4}' );", guid, DateTime.Now.ToString("yyyy/MM/dd HH:mm:ss.fff"), station, dataName, dataValue);
DB.InsertSql(sql);
}
public static List<WaferHistoryMetrology> GetWaferProcessDatas(string id)
{
List<WaferHistoryMetrology> list = new List<WaferHistoryMetrology>();
try
{
string cmdText = $"SELECT * FROM \"wafer_process_data\" where \"wafer_guid\" = '{id}' order by \"process_time\" ASC limit 1000;";
DataSet dataSet = DB.ExecuteDataSet(cmdText);
if (dataSet == null)
{
return list;
}
if (dataSet.Tables.Count == 0 || dataSet.Tables[0].Rows.Count == 0)
{
return list;
}
for (int i = 0; i < dataSet.Tables[0].Rows.Count; i++)
{
WaferHistoryMetrology waferHistoryMetrology = new WaferHistoryMetrology();
waferHistoryMetrology.stationname = dataSet.Tables[0].Rows[i]["station"].ToString();
waferHistoryMetrology.processtime = dataSet.Tables[0].Rows[i]["processtime"].ToString();
waferHistoryMetrology.dataname = dataSet.Tables[0].Rows[i]["data_name"].ToString();
waferHistoryMetrology.datavalue = dataSet.Tables[0].Rows[i]["data_value"].ToString();
list.Add(waferHistoryMetrology);
}
}
catch (Exception ex)
{
LOG.Write(ex);
}
return list;
}
}
}