Sic.Framework/MECF.Framework.Common/Aitex/Sorter/Common/WaferHistoryMetrology.cs

23 lines
385 B
C#

using System;
using System.Runtime.Serialization;
namespace Aitex.Sorter.Common
{
[Serializable]
[DataContract]
public class WaferHistoryMetrology
{
[DataMember]
public string dataname { get; set; }
[DataMember]
public string datavalue { get; set; }
[DataMember]
public string processtime { get; set; }
[DataMember]
public string stationname { get; set; }
}
}